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Instant Total Internal Reflection Fluorescence/Structured Illumination Microscopy (instant TIRF/SIM)

This technology includes a method which enables high-speed, super-resolution microscopy at a very high signal-to-noise ratio (SNR), for biological applications within ~200 nm (the evanescent wave decay length) of a coverslip surface. Instant TIRF/SIM may be implemented simply by modifying and adding to the excitation optics that are already present...

Published: 8/12/2024 | Inventor(s): Hari Shroff, Justin Taraska, Abhishek Kumar, Min Guo

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Category(s): Application > Research Materials, Collaboration Sought > Licensing, ResearchProducts > Research Equipment