Instant Total Internal Reflection Fluorescence/Structured Illumination Microscopy (instant TIRF/SIM)

Description:

This technology includes a method which enables high-speed, super-resolution microscopy at a very high signal-to-noise ratio (SNR), for biological applications within ~200 nm (the evanescent wave decay length) of a coverslip surface. Instant TIRF/SIM may be implemented simply by modifying and adding to the excitation optics that are already present within a conventional instant SIM design. We enforce TIRF excitation by removing all wave vectors that propagate into the objective lens at sub-critical angles.

Patent Information:
For Information, Contact:
Lunet Luna
Technology Transfer Manager
NIH Technology Transfer
301.443.7786
lunet.luna@nih.gov
Inventors:
Hari Shroff
Justin Taraska
Abhishek Kumar
Min Guo
Keywords:
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