A Novel X-ray Grating to Enhance Phase Contrast Imaging

Description:
The present invention relates to improving x-ray phase contrast imaging. The invention discloses a novel grating interferometer for phase contrast imaging with hard x-rays that overcomes limitations in the level of sensitivity by utilizing the advantages of far-field interferometers. The novel design and fabrication process can easily acquire absolute and differential phase images of lightly absorbing samples.
Patent Information:
For Information, Contact:
Michael Shmilovich
Senior Licensing And Patenting Manager
NIH Technology Transfer
301-435-5019
shmilovm@nih.gov
Inventors:
Han Wen
Keywords:
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Balanced
GRATING
INTERFEROMETER
Two-arm
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X-RAY
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